Chroma 3380

VLSI Test system model 3380

KEY FEATURES
50/100 MHz clock rate
50/100 Mbps data rate
1024 I/O pins (max. 1280 I/O pins)
Up to 1024 sites parallel testing
32/64/128M pattern memory
16M capture memory per pin
Various VI source
Flexible hardware architecture (interchangeable I/O, VI, ADDA,)
Real parallel trim/match function
Time and frequency measurement unit (TFMU)
STDF tools support
Test program/pattern converter
(J750, D10, S50/100, E320, SC312, V7, TRI-6036, etc.)
AD/DA test (16/24 bits option)
SCAN test option (max. 2G bits/chain)
ALPG test option for embedded memory
CRAFT C/C++ programming language
Software interface same as 3380P/3360P
User-friendly Windows 7 environment
Real time pattern editor with fail pin/fail address display
Versatile test analysis tools: Shmoo plot, Waveform display, Wafer Map, Pin Margin, Scope tool, Histogram tool and etc.