Teradyne Ultra FLEX Plus
Ultra FLEX Plus Semiconductor Test Platform
The UltraFLEXplus combines new instrument and software capabilities with a revolutionary tester infrastructure that provides a step-function improvement in throughput and engineering efficiency – all while leveraging the cumulative test IP developed over the UltraFLEX’s long history.
The UltraFLEXplus has 3 base systems that allow customers to optimize capital cost, floor space and maximum resource count. All three versions utilize the Broadside DIB for higher density, higher site counts, and simplified routing.
UltraFLEXplus Q24
24-slot system
UltraFLEXplus Q12
12-slot system
UltraFLEXplus Q6
6-slot system