Amkor Lancaster-V1

New Lancaster-V1

Amkor proudly unveils its cutting-edge in-house boundary-scan tester (BST), known as the Lancaster-V1. Crafted by our proficient test engineering teams, these boundary scan solutions have been meticulously engineered to conduct 1149.1 tests within the in-circuit test environment, all under FPGA control. The Lancaster-V1 leverages existing tester instrumentation hardware to seamlessly apply BST vectors, elevating the overall test fault coverage. Notably, the execution of boundary scan tests is achieved without the need for supplementary hardware, such as conversion kits or power supplies. This is another testament to Amkor’s commitment to innovation and efficiency in testing.

Targeted Applications

• Digital – ASIC, datacom, FPGA, ADAS controllers, chipsets, graphic and application processors and microcontrollers
• SoC & SiP – Mixed signal, audio/video processors, ADC/DAC, PMIC and MCM
• The Lancaster V1 is perfect for customers looking for a dependable, low-cost, reduced test-time solution