SPEA H3580

Pick&Place Test Handler

SPEA Test Handlers are designed to perform the high-throughput pick&place handling of IC components (packaged, or in strip/wafer frame) during the final test phase.

Their modular design is open to compose a variety of input / output media configurations, to best fit with your process, with the possibility to modify the configuration also at your site, by retrofitting different input / output modules:

• Input from tray, wafer/strip frame, tape, or bowl feeder
• Output on tray, wafer/strip frame, tape or box

Mechanical architecture is based on full linear motion technology, with controlled axis acceleration and speed, to guarantee fast and accurate handling. Motion profiles and contacting mechanism minimize the force applied to the devices: H3580 can handle MEMS devices with no extra shock to their internal micromechanical structure.